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ISO 17297:2025

ISO 17297:2025

ISO 17297:2025 Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

standard byInternational Organization for Standardization , 05/01/2025

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This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

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Published:

05/01/2025

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1 file , 1 Byte

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This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus

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