IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle)

IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle)
standard by IEEE, 05/16/2018

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Full Description

Scope

The 1671 bundle for automatic test markup language (ATML) specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard. It provides exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). An exchange format in using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT). It also specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). It specifies an exchange format using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).

Abstract

- Active.The 1671 bundle supports the development of Test Program Sets (TPSs) that will be used in an automatic test environment. It specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). It contains downloadable .xsd files from http://standards.ieee.org/downloads/1671/. This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS). This test station may be used as a component of a test program set to test and diagnose a unit under test. This bundle consists of IEEE 1671-2010, IEEE 1671.1-2017, IEEE 1671.2-2012, IEEE 1671.3-2017, IEEE 1671.4-2014, IEEE 1671.5-2015, IEEE 1671.6-2015.