Full Description

Scope

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.The technology types covered are:* forward biased diodes* Zener breakdown diodes* avalanche breakdown diodes* punch-through diodes* fold-back diodesThis standard does not cover thyristor surge protective components, see (b-IEEE Std C62.37)

Abstract

New IEEE Standard - Active - Draft.This standard defines the basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations or network operators.

Product Details

Published: 10/31/2019 ISBN(s): 9781504458719 Number of Pages: 40 File Size: 1 file , 1.3 MB Product Code(s): STDAPE23708