Descriptors
Semiconductor devices, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Thin films, Test specimens, Specimen preparation, Control samples, Tensile testing
Title in French
Dispositifs a semiconducteurs. Dispositifs microelectromecaniques. Eprouvette dessai normalisee en couche mince pour lessai de traction
Title in German
Halbleiterbauelemente. Bauteile der Mikrosystemtechnik. Duennschicht-Standardmikroprobe fuer die Pruefung der Zugbeanspruchung
Pages
12
File Size
432.9 KB
Price
82.00