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Home>BS EN 60749-34:2010

BS EN 60749-34:2010

Standard Number
BS EN 60749-34:2010
Title
Semiconductor devices. Mechanical and climatic test methodsPower cycling
Status
Current
Publication Date
28 February 2011
Cross References
IEC 60747-1:2006, IEC 60747-2:2000, IEC 60747-6:2000, IEC 60749-3, IEC 60749-23, EN 60749-3, EN 60749-23, IEC 60747, IEC 60748
Replaces
BS EN 60749-34:2004

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Thermal stress, Stress, Stress analysis, Power losses, Low voltage, Electrical testing, Destructive testing
Title in French
Dispositifs semiconducteurs. Mthodes dessais mcaniques et climatiques. Cycles en puissance
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Lastwechselprfung
Pages
14
File Size
1.371 MB
Price
82.00

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