Descriptors
Semiconductor devices, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Thin films, Tensile testing, Fatigue testing, Axial stress, Test specimens, Test equipment
Title in French
Dispositifs semiconducteurs. Dispositifs microlectromcaniques. Mthodes dessais de fatigue axiale des matriaux en couche mince
Title in German
Halbleiterbauelemente. Bauelemente der Mikrosystemtechnik. Prfverfahren zur uniaxialen Dauerschwingfestigkeit von Dnnschicht-Werkstoffen
Pages
20
File Size
1.3 MB
Price
100.00