Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Operating conditions, Endurance testing, Life (durability), Accelerated testing, High-temperature testing, Thermal testing, Performance testing, Reliability, Qualification approval
Title in French
Dispositifs semiconducteurs. Mthodes dessais mcaniques et climatiques. Dure de vie en fonctionnemement haute temprature
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Lebensdauer bei hoher Temperatur
Pages
12
File Size
615.5 KB
Price
82.00