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BS EN 60749-7:2011

Standard Number
BS EN 60749-7:2011
Title
Semiconductor devices. Mechanical and climatic test methodsInternal moisture content measurement and the analysis of other residual gases
Status
Current
Publication Date
30 September 2011
Cross References
IEC 60749-8
Replaces
BS EN 60749-7:2002

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Moisture measurement, Gas analysis, Water vapour, Water-vapour tests
Title in French
Dispositifs semiconducteurs. Mthodes dessais mcaniques et climatiques. Mesure de la teneur en humidit interne et analyse des autres gaz rsiduels
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Messung des inneren Feuchtegehaltes und Analyse von anderen Restgasen
Pages
16
File Size
1.014 MB
Price
100.00

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