BS QC 750100:1986

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

Cross References:
BS 2011:Part 2.1Q
BS 3934
BS 6493:Section 1. 1
BS 6493:Section 1.2
BS 6493:Section 1.3
BS 6493:Section 1.6
BS 6493:Section 1.8
BS 6493:Part 3
BS 9000:Part 1
BS 9970:Part 0
IEC 747
IEC 748
IEC 749
IEC 47(Central Office)756
IEC 47(Central Office)810
IEC 47(Central Office)886
IEC 47(Central Office)887
IEC 47(Central Office)888
IEC 47(Central Office)891
IEC 47(Central Office)892
IEC 47(Central Office)955




Keywords: Electronic equipment and components; Semiconductor devices; Semiconductors; Inspection; Electrical testing; Electrical measurement; Quality assurance systems; Assessed quality; Qualification approval; Approval testing; Inspection; Specification (approval) ; Electric terminals; Identification methods; Colour codes; Detail specification; Quality control ; Statistical quality control

Product Code(s): 10570586,10570586