BS IEC 60747-10:1991

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.

Cross References:
BS 2011:Part 1.1
BS 2011:Part 2.1
BS 3934:Part 1
BS 3934:Part 2
BS 3934:Part 3
BS 3939
BS 5555
BS 6001:Part 1
BS 6100:Section 3. 1
BS 6493:Section 1.1
BS 6493:Section 1.2
BS 6493:Section 1.3
BS 6493:Section 1.5
BS 6493:Section 2.1
BS 6493:Section 2.2
BS 6493:Section 2.3
BS 6493:Part 3
BS 7151
BS 9000:Part 3
BS QC 790100


Replaces BS 9450:1998 which remains current and BS 9970:Part 0:1985 which is withdrawn.

Incorporates the following:
AMD 9348 published 15 February 1997
Corrigendum, July 2011



Keywords: Semiconductor devices; Integrated circuits; Electronic equipment and components; Quality assurance systems; Assessed quality; Qualification approval; Approval testing; Inspection; Specification (approval); Marking; Endurance testing; Sampling methods; Accelerated testing; Testing conditions; Capability approval; Documents; Sampling tables ; Dimensions; Orientation

Product Code(s): 30243568,30243568

This product replaces:BS 9450:1998 - Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test